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Electrical characterization of Al/Si ohmic contacts to heavily boron doped polycrystalline diamond films

Authors :
Werner, M.
Johnston, C.
Chalker, P.R.
Romani, S.
Buckley-Golder, I.M.
Source :
Journal of Applied Physics. March 1, 1996, Vol. 79 Issue 5, p2535, 7 p.
Publication Year :
1996

Subjects

Subjects :
Diamond films -- Research
Physics

Details

ISSN :
00218979
Volume :
79
Issue :
5
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.18349882