Phase-change random access memory: a scalable technology

Authors :: Raoux, S.
Burr, G.W.
Breitwisch, M.J.
Rettner, C.T.
Chen, Y.-C.
Shelby, R.M.
Salinga, M.
Krebs, D.
Chen, S.-H.
Lung, H.-L.
Lam, C.H.
Source :: IBM Journal of Research and Development. July-Sept, 2008, Vol. 52 Issue 4-5, p465, 15 p.
Publication Year :: 2008

Subjects :: Technology application
RAM
Computer industry
Microcomputer industry
Random access memory -- Usage
Computer industry -- Technology application
Thin films -- Usage
Dielectric films -- Usage

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