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Temperature and stress time history responses in electronic packaging

Authors :
Lau, John H.
Source :
IEEE Transactions on Components, Packaging and Manufacturing Technology Part. Feb, 1996, Vol. 19 Issue 1, p248, 7 p.
Publication Year :
1996

Abstract

A study presents the time history temperature and stress responses in electronic packages when subjected to an instantaneous and a harmonic heat source. Various charts and curves relate the variables, frequency, time, heat, temperature, stress, displacement, and material characteristics. They are useful for engineering practice, designing of packages, verification of finite element analysis methods for thermoelesticity, and data interpretation.

Details

ISSN :
10709894
Volume :
19
Issue :
1
Database :
Gale General OneFile
Journal :
IEEE Transactions on Components, Packaging and Manufacturing Technology Part
Publication Type :
Academic Journal
Accession number :
edsgcl.18250548