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Magnetic moment investigation of epitaxial magnetite thin films

Authors :
Kallmayer, M.
Hild, K.
Elmers, H.J.
Arora, S.K.
Han-Chun Wu
Sofin, R.G.S.
Shvets, I.V.
Source :
Journal of Applied Physics. April 1, 2008, Vol. 103 Issue 7, 07D715-1-07D715-3
Publication Year :
2008

Abstract

X-ray magnetic circular dichroism (XMCD) is used for studying the epitaxial magnetite ([Fe.sub.3][O.sub.4]) films on MgO (001) and [Al.sub.2][O.sub.3] (0001) substrates. The differences observed between film grown on MgO and [Al.sub.2][O.sub.3] are described within the framework of differences in mismatch strain experienced by the films.

Subjects

Subjects :
Aluminum oxide -- Magnetic properties
Circular dichroism -- Analysis
Magnesium oxide -- Magnetic properties
Magnetic moment -- Analysis
Magnetite -- Structure
Magnetite -- Magnetic properties
Physics

Details

Language :
English
ISSN :
00218979
Volume :
103
Issue :
7
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.180532117

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