Self-assembled thulium silicide nanostructures on silicon(001) studied by scanning tunneling microscopy and transmission electron microscopy

Authors :: Crimp, M.A.
Nogami, J.
Source :: Journal of Applied Physics. March 15, 2008, Vol. 103 Issue 6, 064308-1-064308-5
Publication Year :: 2008
Abstract: A combination of scanning tunneling microscopy (STM) and transmission electron microscopy (TEM) were used to study the initial stages of epitaxial growth of thulium (Tm) silicide on Si(001). The degree of correspondence observed between features of STM and TEM indicated that the hexagonal phase might form nanowires or elongated islands with some periodic lateral relaxation.

Subjects :: Silicon compounds -- Optical properties
Scanning tunneling microscopy -- Observations
Epitaxy -- Analysis
Physics

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