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Faster computed tomography: microfocus computed tomography extends from the lab to the production floor
- Source :
- Quality. April 2008, Vol. 47 Issue 4, p36, 5 p.
- Publication Year :
- 2008
-
Abstract
- Shrinking device geometries in electronic and electromechanical components and microsystems enable continuous growth in complexity. These technologies drive the need to virtually cross-section a sample to simplify inspection. Computed tomography [...]
Details
- Language :
- English
- ISSN :
- 03609936
- Volume :
- 47
- Issue :
- 4
- Database :
- Gale General OneFile
- Journal :
- Quality
- Publication Type :
- Periodical
- Accession number :
- edsgcl.178454024