Back to Search Start Over

As SOCs grow, instruments move on-chip

Authors :
Wilson, Ron
Source :
Test & Measurement World. April 1, 2008, Vol. 28 Issue 3, p23
Publication Year :
2008

Abstract

Ron Wilson, Executive Editor, EDN As system-level ICs grow larger and more complex, they become impossible to observe and stimulate. Internal nodes aren't accessible to bonding pads or even to […]

Subjects

Subjects :
Embedded system
System on a chip
Semiconductor industry
Analog Devices Inc. -- Product information
Embedded systems -- Product information
Semiconductor industry -- Product information

Details

Language :
English
ISSN :
07441657
Volume :
28
Issue :
3
Database :
Gale General OneFile
Journal :
Test & Measurement World
Publication Type :
Periodical
Accession number :
edsgcl.177548642

Tools

Authors Abstract Subjects Details