Hysteretic behavior of the transport critical current density in a bent Bi-Pb-Sr-Ca-Cu-O silver sheathed tape

A study of the hysteretic behavior of transport critical current density of a flexible Bi-based tape with bending strain, measured at 77 degree kelvin shows a gradual decrease in hysteresis with the increase in bending strain. The value of the critical current density at zero field and that of the effective remnant field remain unaffected by the change of the bending strain. The bending strain cannot change the intrinsic pinning properties and the fractured grain boundaries created by bending strain decrease the transport critical current.