Reliability tests for Weibull distribution with variational shape parameter based on sudden death lifetime data

To link to full-text access for this article, visit this link: http://dx.doi.org/10.1016/j.ejor.2007.05.043 Byline: Ikuo Arizono (a), Yuuki Kawamura (a), Yasuhiko Takemoto (b) Keywords: Acceptance sampling plan; Chi-square approximation; Mean time to failure; Reliability test; Sudden death testing; Weibull distribution Abstract: In the traditional design of reliability tests for assuring the mean time to failure (MTTF) in Weibull distribution with shape and scale parameters, it has been assumed that the shape parameter in the acceptable and rejectable populations is the same fixed number. For the purpose of expanding applicability of the reliability testing, Hisada and Arizono have developed a reliability sampling scheme for assuring MTTF in the Weibull distribution under the conditions that shape parameters in the both populations do not necessarily coincide, and are specified as interval values, respectively. Then, their reliability test is designed using the complete lifetime data. In general, the reliability testing based on the complete lifetime data requires the long testing time. As a consequence, the testing cost becomes sometimes expensive. In this paper, for the purpose of an economical plan of the reliability test, we consider the sudden death procedure for assuring MTTF in Weibull distribution with variational shape parameter. Author Affiliation: (a) Osaka Prefecture University, Sakai, Osaka 599-8531, Japan (b) University of Hyogo, Kobe, Hyogo 651-2197, Japan Article History: Received 23 October 2006; Accepted 26 May 2007