BIST for measuring clock jitter of charge-pump phase-locked loops

Subjects

Subjects :

Integrated circuit fabrication
Analog integrated circuits -- Design and construction
Analog integrated circuits -- Research
Integrated circuit fabrication

Details

Language :

English

ISSN :

00189456

Volume :

57

Issue :

2

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.174808907