Signal-to-noise in silicon microstrip detectors with binary readout

Authors :: DeWitt, J.
Dorfan, D.
Dubbs, T.
Grillo, A.
Hubbard, B.
Kashigin, S.
Noble, K.
Pulliam, T.
Rahn, J.
Rowe, W.A.
Sadrozinski, F.-W.
Seiden, A.
Spencer, E.
Webster, A.
Wilder, M.
Williams, D.C.
Ciocio, A.
Collins, T.
Kipnis, I.
Spieler, H.
Iwasaki, H.
Kohriki, T.
Kondo, T.
Terada, S.
Unno, Y.
Iwata, Y.
Ohmoto, T.
Ohsugi, T.
Yoshikawa, M.
Takashima, R.
Maeohmichi, H.
Takahata, M.
Tamura, N.
Source :: IEEE Transactions on Nuclear Science. August, 1995, Vol. 42 Issue 4, p445, 6 p.
Publication Year :: 1995
Abstract: We report the results of a beam test at KEK using double-sided AC-coupled silicon microstrip detectors with binary readout, i.e., a readout where the signals are discriminated in the front-end electronics and only the hit location as kept. For strip pitch between 50[Mu] and 200[Mu], we determine the efficiency and the noise background as function of threshold setting. This allows us to reconstruct the Landau pulse height spectrum and determine the signal/noise ratio. In addition, the threshold/noise ratio necessary for operation with low occupancy is determined.