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Random walk guided decap embedding for power/ground network optimization
- Source :
- IEEE Transactions on Circuits and Systems-II-Express Briefs. Jan, 2008, Vol. 55 Issue 1, p36, 5 p.
- Publication Year :
- 2008
-
Abstract
- The reliability of Power/Ground networks is becoming significantly important in modern integrated circuits, while decap insertion is a main approach to enhance the power grid safety. In this brief, we propose a fast and efficient decap allocation algorithm, and adequately consider the leakage effect of decap. This approach borrows the idea of random walks to perform circuit partitioning and does subsequent decap insertion based on locality property of partitioned area, which avoids solving a large nonlinear programming problem in traditional decap optimization process. The optimization flow also integrates a refined leakage current model for decaps which makes it more practical. Experimental results show that our proposed method can achieve approximate 15X speed up over the optimal budget method within the acceptable error tolerance. Also this algorithm only causes a few penalty area to compensate the leakage effect. Index Terms--Leakage, optimization, power/ground (P/G) network, random walks.
- Subjects :
- Algorithms -- Usage
Embedded systems -- Design and construction
Circuit design -- Research
Electric currents -- Grounding
Electric currents -- Research
Algorithm
Embedded system
System on a chip
Circuit designer
Integrated circuit design
Business
Computers and office automation industries
Electronics
Electronics and electrical industries
Subjects
Details
- Language :
- English
- ISSN :
- 15497747
- Volume :
- 55
- Issue :
- 1
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Circuits and Systems-II-Express Briefs
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.174324708