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Scope
- Source :
- EDN. January 24, 2008, Vol. 53 Issue 2, 80
- Publication Year :
- 2008
-
Abstract
- Edited by Ron Wilson Looking Ahead To Design Automation and Test Europe 2008 The DATE (Design Automation and Test Europe) conference will run from March 10 through 14 in Munich, [...]
- Subjects :
- United States. Army -- Technology application -- Conferences, meetings and seminars -- Management
Semiconductor industry -- Industry forecasts -- Conferences, meetings and seminars -- Technology application -- 2008 AD
Electronics industry -- Conferences, meetings and seminars -- Industry forecasts -- Technology application -- 2008 AD
Computer terminals -- Usage -- Conferences, meetings and seminars -- Technology application -- 2008 AD
Business
Electronics and electrical industries
Semiconductor industry
Company business management
Computer terminal
Technology application
Electronics industry
Management
Usage
Conferences, meetings and seminars
Industry forecasts
Subjects
Details
- Language :
- English
- ISSN :
- 00127515
- Volume :
- 53
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- EDN
- Publication Type :
- Periodical
- Accession number :
- edsgcl.173920196