A method for the automatic selection of test frequencies in analog fault diagnosis

Subjects

Subjects :

Integrated circuit fabrication
Analog integrated circuits -- Design and construction
Analog integrated circuits -- Comparative analysis
Genetic algorithms -- Measurement
Integrated circuit fabrication -- Analysis

Details

Language :

English

ISSN :

00189456

Volume :

56

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.173772026