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The SURE-LET approach to image denoising

Authors :
Blu, Thierry
Luisier, Florian
Source :
IEEE Transactions on Image Processing. Nov, 2007, Vol. 16 Issue 11, p2778, 9 p.
Publication Year :
2007

Abstract

The article presents computational efficiency of the Stein's unbiased risk estimate (SURE), a new approach to image denoising.

Subjects

Subjects :
Algorithms -- Usage
Image processing -- Research
Wavelet transforms -- Research
Algorithm
Business
Computers
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
10577149
Volume :
16
Issue :
11
Database :
Gale General OneFile
Journal :
IEEE Transactions on Image Processing
Publication Type :
Academic Journal
Accession number :
edsgcl.172965667

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