Degradation analysis of 2-[mu]m DFB laser using optical beam-induced current technique

Authors :: Takeshita, Tatsuya
Sato, Tomonari
Mitsuhara, Manabu
Kondo, Yasuhiro
Sugo, Mitsuru
Kato, Kazutoshi
Source :: IEEE Transactions on Electron Devices. Oct, 2007, Vol. 54 Issue 10, p2644, 6 p.
Publication Year :: 2007
Abstract: The analysis of the degradation behavior of 2-[mu]m wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant power aging is discussed. Results suggest the governance of degradation mechanism by diffused defects with parallel direction in the crystal plane.

Subjects :: Feedback (Electronics) -- Analysis
Quantum theory -- Analysis
Semiconductor lasers -- Optical properties
Semiconductor lasers -- Electric properties
Business
Electronics
Electronics and electrical industries

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