Beam focussing for field-emission flat-panel displays

Finite difference and finite element methods help model the performance characteristics of micro-fabricated gate field emitters used in flat-panel display operations. Results from the modeling include electron beam widths, electrode current-voltage features, electrical stress and image quality and indicate that incorporation of an integrated aperture electrode for electron focussing enhances the cathode-gate drive voltage by 30%. The electron beam widths vary between tens of microns and facilitate full-color resolution with more than 100 lines per inch.