Cite
High-precision oxygen isotope analysis of picogram samples reveals 2 [micro]m gradients and slow diffusion in zircon
MLA
Page, F.Zeb, et al. “High-Precision Oxygen Isotope Analysis of Picogram Samples Reveals 2 [Micro]m Gradients and Slow Diffusion in Zircon.” American Mineralogist, vol. 92, no. 10, Oct. 2007, p. 1772. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.169823163&authtype=sso&custid=ns315887.
APA
Page, F. Z., Ushikubo, T., Kita, N. T., Riciputi, L. R., & Valley, J. W. (2007). High-precision oxygen isotope analysis of picogram samples reveals 2 [micro]m gradients and slow diffusion in zircon. American Mineralogist, 92(10), 1772.
Chicago
Page, F. Zeb, T. Ushikubo, N.T. Kita, L.R. Riciputi, and J.W. Valley. 2007. “High-Precision Oxygen Isotope Analysis of Picogram Samples Reveals 2 [Micro]m Gradients and Slow Diffusion in Zircon.” American Mineralogist 92 (10): 1772. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.169823163&authtype=sso&custid=ns315887.