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Compositional analysis by a superconductor-based energy dispersive spectrometer

Authors :
Cristiano, R.
Casaburi, A.
Santagata, C.
Phelan, K.
Buhler, M.
Hohne, J.
Source :
IEEE Transactions on Applied Superconductivity. June, 2007, Vol. 17 Issue 2, p625, 4 p.
Publication Year :
2007

Abstract

The compositional analysis of materials of interest in various contexts obtained by a superconductor-based energy dispersive spectrometers (S-EDS) mounted on a scanning electron microscope is presented.

Subjects

Subjects :
Materials science -- Research
Superconductive devices -- Electric properties
Scanning electron microscopes -- Usage
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
10518223
Volume :
17
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Applied Superconductivity
Publication Type :
Academic Journal
Accession number :
edsgcl.169056662

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