An efficient scan tree design for compact test pattern set

Subjects

Subjects :

Very-large-scale integration -- Analysis
Electric fault location -- Analysis
Electric circuit analysis

Details

Language :

English

ISSN :

02780070

Volume :

26

Issue :

7

Database :

Gale General OneFile

Journal :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publication Type :

Academic Journal

Accession number :

edsgcl.167727089