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Electronic and structural investigations of technetium compounds by X-ray absorption spectroscopy

Authors :
Almahamid, Ilham
Bryan, Jeffrey C.
Bucher, Jerome J.
Burrell, Anthony K.
Edelstein, Norman M.
Hudson, Eric A.
Kaltsoyannis, Nikolas
Lukens, Wayne W.
Shuh, David K.
Nitsche, Heino
Reich, Tobias
Source :
Inorganic Chemistry. Jan 4, 1995, Vol. 34 Issue 1, p193, 6 p.
Publication Year :
1995

Abstract

Analysis of technetium compounds by X-ray absorption near edge structure spectroscopy enables the determination of the chemical shifts of the technetium K edge. Spectral data reveal the significant correlation between oxidation state and chemical shift. In Tc2(CO)10 multiple scattering along the Tc-C-O vector is more important than the direct Tc..O scattering, as revealed by extended X-ray absorption fine structure (EXAFS) spectroscopy. EXAFS spectroscopic study of TcO2 reveals its distorted rutile structure.

Details

ISSN :
00201669
Volume :
34
Issue :
1
Database :
Gale General OneFile
Journal :
Inorganic Chemistry
Publication Type :
Academic Journal
Accession number :
edsgcl.16754815