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Dependence of the interface sharpness of a Ge single quantum well on molecular-beam-epitaxial growth conditions

Authors :
Kissinger, W.
Osten, H.J.
Lippert, G.
Dietrich, B.
Bugiel, E.
Source :
Journal of Applied Physics. Dec 15, 1994, Vol. 76 Issue 12, p8042, 6 p.
Publication Year :
1994

Abstract

Experimental determination of the effect of molecular-beam-epitaxy growth and antimony-mediated growth on the properties of germanium single quantum wells (QWs) on (001) silicon matrix shows that QWs grown using molecular-beam-epitaxy display segregation-induced alloying while antimony-mediated growth conditions confer the best interface sharpness to the QWs at 450 degrees Celsius. Annealing at high temperatures following growth induces Ge and Si interdiffusion that enhance alloying. Antimony-mediated growth conditions enable the surfactant to promote the bulk properties of germanium at high temperatures.

Details

ISSN :
00218979
Volume :
76
Issue :
12
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.16657732