Ferroelectric fatigue endurance of [Bi.sub.4-x][La.sub.x][Ti.sub.3][O.sub.12] thin films explained in terms of x-ray photoelectron spectroscopy

Authors :: Simoes, A.Z.
Riccardi, C.S.
Cavalcante, L.S.
Longo, E.
Varela, J.A.
Mizaikoff, B.
Hess, D.W.
Source :: Journal of Applied Physics. April 15, 2007, Vol. 101 Issue 8, p084112-1, 6 p.
Publication Year :: 2007
Abstract: X-ray photoemission spectroscopy (XPS) is used to evaluate the nature of defects in polycrystalline [Bi.sub.4-x][La.sub.x][Ti.sub.3][O.sub.12] (BLT) thin films. The XPS data has shown a nominal valence state of bismuth lower than 3 and Ti cations are found to be in the 4 state.

Subjects :: Photoelectron spectroscopy -- Usage
Dielectric films -- Electric properties
Thin films -- Electric properties
Ferroelectric crystals -- Research
Physics

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