Experimental and micromagnetic study of track edge noise reduction effect in multilayer thin film media

A time domain spin-stand tester noise measurement and a micromagnetic modeling study are conducted to investigate track edge noise reduction effect in multilayer thin film media. Both experimental and modeling studies show that track edge noise is concentrated in the side written band of a reversed bit-cell, in which the magnetization is opposite to the previous dc erased state. The track edge noise level is substantially suppressed for films laminated with a very thin non-magnetic interlayer. Thus the multi-layer thin film media is more suitable for future narrow track recording.