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Traceability of laser frequency calibrations at MIKES

Authors :
Merimaa, Mikko
Nyholm, K.
Vainio, M.
Lassila, Antti
Source :
IEEE Transactions on Instrumentation & Measurement. April, 2007, Vol. 56 Issue 2, p500, 5 p.
Publication Year :
2007

Subjects

Subjects :
Interferometry -- Methods

Details

Language :
English
ISSN :
00189456
Volume :
56
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
edsgcl.164989201