Low-frequency resistance fluctuation measurements on conducting polymer thin-film resistors

Low-frequency resistance fluctuation in polypyrrole thin-film resistors exhibits a noise magnitude dependency on the applied direct current voltage, indicating that the noise is not caused by fluctuations in equilibrium resistance. Polypyrrole thin films are obtained by chemical-vapor deposition on patterned precursors of copper chloride. The carrier density in these films is estimated by the use of the Hooge formula.