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High-sensitivity two-dimensional thermal- and mechanical-stress-induced birefringence measurements in a Nd:YAG rod
- Source :
- Applied Optics. Sept 20, 1994, Vol. 33 Issue 27, p6368, 5 p.
- Publication Year :
- 1994
-
Abstract
- A novel polarimeter for measuring the two-dimensional (2D) thermal- and mechanical-stress-induced birefringence in solid-state laser materials such as Nd:YAG is proposed. Using this device, we could sensitively measure the direction of the principal birefringence axis as well as the phase shift [Delta] with sign when [Delta] < [Pi]/4. The 2D thermal- and mechanical-stress-induced birefringence in a laser-diode-pumped Nd:YAG rod was successfully measured with the proposed polarimeter. We also found an active quarter-wave Nd:YAG phase retarder.
Details
- ISSN :
- 1559128X
- Volume :
- 33
- Issue :
- 27
- Database :
- Gale General OneFile
- Journal :
- Applied Optics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.16353228