Magnetization reveal in CoFe/Ag/Fe/ZnSe thin layer sandwiches

Authors :: Bilic, D.
Dahlberg, E. Dan
Chaiken, A.
Gutierrez, C.
Lubitz, P.
Krebs, J.J.
Harford, M.Z.
Prinz, G.A.
Source :: Journal of Applied Physics. May 15, 1994, Vol. 75 Issue 10, p7073, 3 p.
Publication Year :: 1994
Abstract: Transverse (TKE) and longitudinal (LKE) magnetooptical Kerr effect measurements in thin magnetic films reveal the magnetic field and spin value effect (SVE)-dependent magnetization reversal in the films. Transitions between the easy axes of the field in the films influence the reversal process and measure anomalous resistance as functions of applied magnetic field.