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Electrical characterization of ZnSe epitaxial layer reactive-ion-etched by a gas mixture of ethane and hydrogen
- Source :
- Journal of Applied Physics. June 15, 1994, Vol. 75 Issue 12, p8231, 3 p.
- Publication Year :
- 1994
-
Abstract
- Reactive ion etching (RIE) of the sheet resistances of ZnSe epitaxial layers using methane and hydrogen gas mixture incorporates a high resistivity region in the sheet resistances. The calculated, electrically active thickness of p- and n-ZnSe layers are smaller than RIE-treated ZnSe epitaxial layers. Current injection and heat treatment effects on the p- and n-high resistivity regions are different.
- Subjects :
- Zinc alloys -- Research
Strength of materials -- Research
Physics
Subjects
Details
- ISSN :
- 00218979
- Volume :
- 75
- Issue :
- 12
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.15595289