IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

Subjects

Subjects :

Circuit designer
Integrated circuit design
Embedded system
System on a chip
Fault location (Engineering) -- Analysis
Crosstalk -- Analysis
Circuit design -- Testing
Embedded systems -- Testing
Embedded systems -- Design and construction

Details

Language :

English

ISSN :

02780070

Volume :

25

Issue :

11

Database :

Gale General OneFile

Journal :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publication Type :

Academic Journal

Accession number :

edsgcl.155728482