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Direct structural evidences of Mn dilution in Ge
- Source :
- Journal of Applied Physics. Sept 15, 2006, Vol. 100 Issue 6, p063528-1, 4 p.
- Publication Year :
- 2006
-
Abstract
- The structural properties of [Mn.sub.x][Ge.sub.1-x] ion implanted alloys at 240 and 270 degree Celsius are studied using X-ray diffraction, transmission electron microscopy, extended X-ray absorption fine structure spectroscopy, and X-ray photoemission spectroscopy. The average efficiency of Mn dilution of ion implantation technique is found to be 50%, which reached a peak value of 100% in the subsurface implanted layer.
- Subjects :
- Ion implantation -- Analysis
X-rays -- Diffraction
X-rays -- Usage
Physics
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 100
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.154827073