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Fractal dimensions of niobium oxide films probed by protons and lithium ions

Authors :
Pehlivan, Esat
Niklasson, Gunnar A.
Source :
Journal of Applied Physics. Sept 1, 2006, Vol. 100 Issue 5, 053506-1-053506-4
Publication Year :
2006

Abstract

Cyclic voltammetry (CV) and atomic force microscopy (AFM) are used to determine fractal surface dimensions of sputter deposited niobium pentoxide films. AFM measurements showed that the former value corresponds to the fractal surface roughness of the films, while the latter value is close to the dimensionality of the distribution of hillocks on the surface.

Subjects

Subjects :
Atomic force microscopy -- Observations
Niobium -- Structure
Niobium -- Optical properties
Voltammetry -- Analysis
Dielectric films -- Structure
Dielectric films -- Optical properties
Thin films -- Structure
Thin films -- Optical properties
Physics

Details

Language :
English
ISSN :
00218979
Volume :
100
Issue :
5
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.154312049

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