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A physics-based analytic solution to the MOSFET surface potential from accumulation to strong-inversion region

Authors :
Jin He
Mansun Chan
Xing Zhang
Yangyuan Wang
Source :
IEEE Transactions on Electron Devices. Sept, 2006, Vol. 53 Issue 9, p2008, 9 p.
Publication Year :
2006

Abstract

A physics-based analytic solution to the MOSFET surface potential from the accumulation to strong-inversion region is derived, based on the complete surface potential equation of the bulk MOSFETs without replying on any smoothing functions or regional separation of MOSFET operation regions. The solution is tested and verified with numerical results for accuracy in the surface potential and transcapacitance predictions.

Details

Language :
English
ISSN :
00189383
Volume :
53
Issue :
9
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.152779257