Back to Search Start Over

Patents and international trade issues

Authors :
Stern, Richard H.
Source :
IEEE Micro. Dec, 1993, Vol. v13 Issue n6, p89, 4 p.
Publication Year :
1993

Details

ISSN :
02721732
Volume :
v13
Issue :
n6
Database :
Gale General OneFile
Journal :
IEEE Micro
Publication Type :
Academic Journal
Accession number :
edsgcl.15081441