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Microdosimetry of the ultraviolet erasable programmable read-only memory experiment on the microelectronics and photonics test bed: recent advances in small-volume analysis

Authors :
Scheick, L.Z.
Blake, B.
McNulty, P.J.
Source :
IEEE Transactions on Nuclear Science. Dec, 2005, Vol. 52 Issue 6, p2300, 7 p.
Publication Year :
2005

Abstract

A commercial ultraviolet erasable programmable read-only memory (UVPROM) was used to demonstrate a dosimetry technique for both ground and space applications. An equivalent amount of UV to reproduce the same amount of erasure was used to calibrate dose. The new method of readout, unlike other methods, does not require the evidence of exposure to be destroyed in the course of a measurement. It requires power only during readout. Results from an experiment using this technique aboard the Microelectronics and Photonics Test Bed (MPTB) satellite are discussed. Application of Extreme Value Theory is used to analyze whether early failures in the device were statistically feasible or more likely due to large, rare energy depositions. A new dosimeter approach using a change injection method that will eliminate the need for UV as a metric is also presented as well new experiments for the devices under test aboard MPTB. Index Terms--Extreme value, extreme value analysis, extreme value theory, floating gate, microdose, MPTB, non-volatile, NVM, UVPROM, satellite, single event, stuck bit, transfer orbit.

Details

Language :
English
ISSN :
00189499
Volume :
52
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.149460114