Statistical interconnect metrics for physical-design optimization

Subjects

Subjects :

Standard IC
Crosstalk -- Analysis
Delay lines -- Analysis
Integrated circuits -- Design and construction
Semiconductor chips -- Design and construction

Details

Language :

English

ISSN :

02780070

Volume :

25

Issue :

7

Database :

Gale General OneFile

Journal :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publication Type :

Academic Journal

Accession number :

edsgcl.148943844