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Bias voltage dependence of magnetic tunnel junctions comprising double barriers and amorphous NiFeSiB layers

Authors :
Byong Sun Chun
Seung Pil Ko
Young Keun Kim
Jae Youn Hwang
Jang Roh Rhee
Jae-Seon Ju
Source :
Journal of Applied Physics. April 15, 2006, Vol. 99 Issue 8, 08A902-1-08A902-3
Publication Year :
2006

Abstract

A double barrier magnetic tunnel junction (DMTJ) comprising an amorphous ferromagnetic NiFeSiB is investigated to reduce bias voltage dependence of tunneling magnetoresistance (TMR) ratio. The DMTJ with an amorphous NiFeSiB free layer offers smooth surface roughness resulting in reduced interlayer coupling field and bias voltage dependence.

Subjects

Subjects :
Physics

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
8
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.148734681