Investigation of compensation defects in CdTe:Cl samples grown by different techniques

Authors :: Eiche, C.
Maier, D.
Sinerius, D.
Weese, J.
Benz, K.W.
Honerkamp, J.
Source :: Journal of Applied Physics. Dec 1, 1993, Vol. 74 Issue 11, p6667, 4 p.
Publication Year :: 1993
Abstract: Photoinduced current transient spectroscopy (PICTS) is used to determine the effects of growth methods on compensation defects in samples of CdTe:Cl. At temperatures between 100 and 140 Kelvin, three distinct traps lead to PICTS signal in every CdTe:Cl sample. A cross section and an activation energy, which is almost similar for the various samples, results from only one trap.

Subjects :: Spectrum analysis -- Usage
Crystals -- Growth
Chlorine -- Analysis
Cadmium -- Analysis
Physics

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