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Thickness dependence of ferroelectric and dielectric properties in (Bi3.15Nd0.85) Ti3O12 thin films
- Source :
- Journal of Applied Physics. April 1, 2006, Vol. 99 Issue 7, p074103-1, 5 p.
- Publication Year :
- 2006
-
Abstract
- The effects of film thickness on the ferroelectric and dielectric properties are studied for the (Bi3.15Nd0.85)Ti3O12 (BNdT) films deposited on Pt/TiO2/Si(001) substrates by rf sputtering. The nonlinear dielectric behavior observed for BNdt films reveals occurrence of the domain wall pinning arising from the structural defects.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 99
- Issue :
- 7
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.146463268