Resistive transition of Bi(2223) silver clamped thick film

Authors :: Han, G.C.
Wang, Y.G.
Han, H.M.
Wang, Z.H.
Wang, S.X.
Yuan, W.F.
Liu, Z. M.
Huang, Q.L.
Chen, J.L
Source :: Journal of Applied Physics. Oct 15, 1993, Vol. 74 Issue 8, p5108, 4 p.
Publication Year :: 1993
Abstract: Bi(2223) thick films are investigated to measure their voltage-current (V-I) curves and magnetoresistance (R-H) at different temperatures and magnetic fields. An increase in temperature and magnetic fields cause a transition in flux lattice melting. A flux-flow-like character is exhibited by V-I curves. RH measurements show that the magnetic fields conform to an exponential low dependent on temperature.