Evolution of the Pt layer deposited on MgO(001) by pulsed laser deposition as a function of the deposition parameters: A scanning tunneling microscopy and energy dispersive X-ray diffractometry/reflectometry study

A study is carried out on the morphology of Pt layers grown on MgO(001) by pulsed layer deposition as a function of the deposition temperature and deposition time with a combined use of ultrahigh vacuum scanning tunneling microscopy (STM-UHV) and energy dispersive X-ray diffractormetry/reflectometry (EDXD/EDXR). The results have shown that the combined use of the STM-UHV and EDXD/EDXR methods gives the morphological and structural information required for an oriented film growth, as required for magnetic recording application.