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Noise modeling methodologies in the presence of mobility degradation and their equivalence
- Source :
- IEEE Transactions on Electron Devices. Feb, 2006, Vol. 53 Issue 2, p348, 8 p.
- Publication Year :
- 2006
-
Abstract
- A demonstration on some methodologies adapted to incorporate mobility degradation and show that for any arbitrary mobility model all the methods yield the same result for drain and induced gate noise current. The equivalence between all the three most important noise calculation methodologies without the need for constant mobility assumption is demonstrated.
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 53
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.144852771