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Noise modeling methodologies in the presence of mobility degradation and their equivalence

Authors :
Roy, Ananda, S.
Enz, Christian C.
Sallese, Jean-Michel
Source :
IEEE Transactions on Electron Devices. Feb, 2006, Vol. 53 Issue 2, p348, 8 p.
Publication Year :
2006

Abstract

A demonstration on some methodologies adapted to incorporate mobility degradation and show that for any arbitrary mobility model all the methods yield the same result for drain and induced gate noise current. The equivalence between all the three most important noise calculation methodologies without the need for constant mobility assumption is demonstrated.

Details

Language :
English
ISSN :
00189383
Volume :
53
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.144852771