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Calibration of 254-nm irradiance based on the silicon photodiode self-calibration technique
- Source :
- Applied Optics. Sept 1, 1993, Vol. 32 Issue 25, p4815, 7 p.
- Publication Year :
- 1993
-
Abstract
- A method of calibrating the germicidal irradiance (254 nm) based on the silicon photodiode self-calibration technique has been developed. The absolute responsivity of silicon photodiodes at 254 nm was determined by the self-calibration technique at 633 nm combined with the relative spectral responsivity measurement in the 220-780-nm region based on a standard thermal detector. By using pure 254-nm radiation, the responsivity at 254 nm was transferred to a working standard detector with a sensitivity of only approximately 254 nm. The irradiance values measured by this detector are compared with those measured with conventional methods; for one method we used an absolutely calibrated thermal detector; for another method we used a monochromator with a spectral irradiance standard. They agreed to within a 3% difference.
Details
- ISSN :
- 1559128X
- Volume :
- 32
- Issue :
- 25
- Database :
- Gale General OneFile
- Journal :
- Applied Optics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.14446483