Back to Search Start Over

Calibration of 254-nm irradiance based on the silicon photodiode self-calibration technique

Authors :
Ohkubo, K.
Ohno, Y.
Nakagawa, Y.
Source :
Applied Optics. Sept 1, 1993, Vol. 32 Issue 25, p4815, 7 p.
Publication Year :
1993

Abstract

A method of calibrating the germicidal irradiance (254 nm) based on the silicon photodiode self-calibration technique has been developed. The absolute responsivity of silicon photodiodes at 254 nm was determined by the self-calibration technique at 633 nm combined with the relative spectral responsivity measurement in the 220-780-nm region based on a standard thermal detector. By using pure 254-nm radiation, the responsivity at 254 nm was transferred to a working standard detector with a sensitivity of only approximately 254 nm. The irradiance values measured by this detector are compared with those measured with conventional methods; for one method we used an absolutely calibrated thermal detector; for another method we used a monochromator with a spectral irradiance standard. They agreed to within a 3% difference.

Details

ISSN :
1559128X
Volume :
32
Issue :
25
Database :
Gale General OneFile
Journal :
Applied Optics
Publication Type :
Academic Journal
Accession number :
edsgcl.14446483