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Structure optimization of trench-isolated SiGe HBTs for simultaneous improvements in thermal and electrical performances

Authors :
Jae-Sung Rieh
Greenberg, David
Qizhi Liu
Joseph, Alvin J.
Freeman, Greg
Ahlgren, David C.
Source :
IEEE Transactions on Electron Devices. Dec, 2005, Vol. 52 Issue 12, p2744, 9 p.
Publication Year :
2005

Abstract

SiGe heterojunction bipolar transistors (HBT) structures are optimized for achieving simultaneous improvements in thermal and electrical performance. The results shed light on the possibility of optimizing SiGe HBTs for improvements in both thermal and electrical performances.

Details

Language :
English
ISSN :
00189383
Volume :
52
Issue :
12
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.143050499