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Far-infrared soft-made behavior in PbSc1/2Ta1/2O3 thin films

Authors :
Kamba, S.
Berta, M.
Setter, N.
Hlinka, J.
Kempa, M.
Petzelt, J.
Brinkman, K.
Source :
Journal of Applied Physics. Oct 1, 2005, Vol. 98 Issue 7, p074103-1, 6 p.
Publication Year :
2005

Abstract

Temperature dependences of the optic phonons in PbSc1/2Ta1/2O3 (PST) sol-gel films deposited on sapphire substrate are studied by means of Fourier transform far-infrared transmission spectroscopy in the temperature range of 20-900 K. In all the four films displaying different B-site order, the transverse-optic (TO) mode near 80 cm(super -1) at 10 K softens on heating to approximately 45 cm(super -1).

Subjects

Subjects :
Dielectric films -- Electric properties
Dielectric films -- Design and construction
Thin films -- Electric properties
Thin films -- Design and construction
Scandium -- Electric properties
Lead compounds -- Electric properties
Tantalum -- Electric properties
Physics

Details

Language :
English
ISSN :
00218979
Volume :
98
Issue :
7
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.140138556

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