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A study of thermal stress and intrinsic residual stress in planar metallization for integrated power modules

Authors :
Zhu, Ning
van Wyk, Jacobus Daniel
Liang, Zhenxian
Odendaal, Willem G. Hardus
Source :
IEEE Transactions on Industry Applications. Nov-Dec, 2005, Vol. 41 Issue 6, p1603, 9 p.
Publication Year :
2005

Abstract

In integrated power modules, mechanical properties of interfaces between deposited copper traces and substrates are important for reliable operation. This paper investigates the values of thermomechanical stresses by IDEAS simulation and describes an experimental method to calculate intrinsic residual stresses using the Stoney equation based on the bending curvature of the sample. Index Terms--Intrinsic residual stress, planar metallization, thermomechanical stress.

Details

Language :
English
ISSN :
00939994
Volume :
41
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Industry Applications
Publication Type :
Academic Journal
Accession number :
edsgcl.139755884