Growth and properties of a multilayer system based on Y1Ba2Cu3Ox and amorphous Y-ZrO2

Y1Ba2Cu3Ox (YBCO) and Y-ZrO2 (YSZ) films were grown by pulsed layer deposition technique on sapphire substrates. It was observed that the c-axis oriented YBCO grows on amorphous YSZ at an optimal thickness of YSZ. An buffer layer of nine nanometers produced a Tc of 89 Kelvin which reflect the strong correlation of the properties of YBCO and the thickness of the buffer layer. The experiment further developed a model which showed the film growth process.