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Thermometry using thermal activation of Josephson junctions at milliKelvin temperatures

Authors :
Ohki, Thomas A.
Wulf, Michael
Steinman, James P.
Feldman, Marc J.
Bocko, Mark F.
Source :
IEEE Transactions on Applied Superconductivity. June, 2005, Vol. 15 Issue 2, p868, 4 p.
Publication Year :
2005

Abstract

The thermal activation of Josephson junctions as a thermometer is used to investigate heat flow from a hot resistor at milliKelvin temperatures on a silicon chip used for superconducting qubit experiments. The results indicate that on-chip resistors can be used below a certain power level, but not above that level.

Details

Language :
English
ISSN :
10518223
Volume :
15
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Applied Superconductivity
Publication Type :
Academic Journal
Accession number :
edsgcl.135956584