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Delayed failure in a shock-loaded silicon carbide
- Source :
- Journal of Applied Physics. June 1, 2005, Vol. 97 Issue 11, 113513-1-113513-7
- Publication Year :
- 2005
-
Abstract
- The shock response of a silicon carbide is investigated using the methods of plate impact, and monitored using manganin stress gauges mounted to be responsive to lateral stress. A two-step stress response is observed, indicating the presence of delayed failure at the impact face.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 97
- Issue :
- 11
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.135951725