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Delayed failure in a shock-loaded silicon carbide

Authors :
Millett, J.C.F.
Bourne, N.K.
Dandekar, D.P.
Source :
Journal of Applied Physics. June 1, 2005, Vol. 97 Issue 11, 113513-1-113513-7
Publication Year :
2005

Abstract

The shock response of a silicon carbide is investigated using the methods of plate impact, and monitored using manganin stress gauges mounted to be responsive to lateral stress. A two-step stress response is observed, indicating the presence of delayed failure at the impact face.

Details

Language :
English
ISSN :
00218979
Volume :
97
Issue :
11
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.135951725