Investigation of temperature dependence of microwave-induced characteristics of a NbN Josephson junction array

The surface resistance of NbN films is measured using the dielectric resonator method at 22 GHz and the temperatures from 5.8 K to 14.8 K to investigate the temperature dependence of microwave-induced characteristics of a NbN Josephson junction array. The rapid decrease in the maximum constant-voltage-step amplitude above 10K is due to significant reduction in microwave power in the junction array.